Enabling Reliable Electrical Characterization for 224G & 448G Optical Systems

As systems move to 224G and early 448G signaling, validating high-speed channels is becoming less about the device itself and more about how you access it.

Even in optical architectures, engineers still rely on electrical characterization during bring-up, compliance, and debug. But at these data rates, the measurement interface can distort results, limit bandwidth, and introduce variability that masks true system performance.
This creates a critical challenge: how do you maintain accurate, repeatable electrical access without the test fixture becoming the weakest link?

In this webinar, we’ll walk through where traditional test approaches begin to break down and how solderless compression-mounted interfaces enable cleaner, more repeatable measurement paths. We’ll focus on practical implementation across real development workflows, from early device evaluation through system-level validation.

Key Takeaways:

• Understand why measurement interfaces become a primary source of error at 224G and beyond
• Identify where electrical access is still required in optical system development workflows
• Learn how fixture-induced loss, discontinuities, and variability impact real measurements
• See how compression-mounted test access improves repeatability across boards, modules, and system validation

Please register using the link in the Details section below.