BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Ardent Concepts - ECPv6.15.18//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://ardentconcepts.com
X-WR-CALDESC:Events for Ardent Concepts
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/New_York
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20240310T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20241103T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20250309T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20251102T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20260308T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20261101T060000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20250515T130000
DTEND;TZID=America/New_York:20250515T140000
DTSTAMP:20260422T072335
CREATED:20250506T174456Z
LAST-MODIFIED:20250506T175132Z
UID:10000570-1747314000-1747317600@ardentconcepts.com
SUMMARY:Maximizing Value with Multi-Purpose Test Vehicles for High-Frequency Testing
DESCRIPTION:Join us for an in-depth look at how multi-purpose test vehicles can maximize signal integrity and mechanical performance for high-frequency testing. As data rates push into the 224G and 448G realm\, traditional fixture designs are no longer enough. Learn how Amphenol’s TR Multicoax solutions enable superior signal breakout\, minimize loss\, and simplify testing without the need for soldered connections. Whether you’re tackling component/IP development\, post-silicon validation\, or production testing\, this webinar will show you how to future-proof your test strategies with cutting-edge interconnect technology. \nKey Takeaways: \n\nReduce PCB losses and improve test performance by utilizing solderless ganged coaxial connectors\, enabling closer breakout to the device under test.\nSimplify complex high-frequency testing with modular\, field-replaceable TR Multicoax interfaces that eliminate the need for reflow soldering.\nFuture-proof your designs for 224G+ development with scalable solutions optimized for higher bandwidth\, reduced footprint\, and superior mechanical durability.\n\nPlease register using the link in the “Details” section:
URL:https://ardentconcepts.com/event/maximizing-value-with-multi-purpose-test-vehicles-for-high-frequency-testing/
ATTACH;FMTTYPE=image/png:https://ardentconcepts.com/wp-content/webpc-passthru.php?src=https://ardentconcepts.com/wp-content/uploads/2024/09/AACTR90RA8x125403WF_2_blue-background.png&amp;nocache=1
END:VEVENT
END:VCALENDAR